In today’s fast growing Systems-on-Chip (SoC), incomplete or ineffective DFT support due to poor specification or loose design practices can quickly become the critical path to making market windows ...
Shipping high-quality ICs requires that design-for-test (DFT) methodologies be included in a design. DFT provides external access at the device’s I/O pins to internal registers to either control or ...
A proven method to simplify a complex problem is to break it into smaller chunks. In the case of today’s large, complex SoCs, this means using hierarchical methods to design the blocks, then combine ...
A look at the basic components of a hierarchical DFT methodology, the benefits it provides and how to automate it. Large System on Chip (SoC) designs present many challenges to all design disciplines, ...
One significant design challenge for today’s SoCs is managing the impact of the very large design size on EDA tools and flows. Front-end and back-end design flows have managed this challenge by ...
Recently, DFT elements have begun to show up in more and more large complex SoC devices. The concept of scan no longer raises the objections of overhead to the extent it used to. Yet, customers and ...
As the demand for processing power for artificial intelligence (AI) applications grows, semiconductor companies are racing to develop AI-specific silicon. The AI market is incredibly dynamic, with ...
Recently, DFT elements have begun to show up in more and more large complex SoC devices. The concept of scan no longer raises the objections of overhead to the extent it used to. Yet, customers and ...
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